SCANNING-X-RAY MICROSCOPY USING A LASER-PLASMA SOURCE

被引：26

作者：

MICHETTE, AG ^{[1
]}

TURCU, ICE ^{[1
]}

SCHULZ, MS ^{[1
]}

BROWNE, MT ^{[1
]}

MORRISON, GR ^{[1
]}

FLUCK, P ^{[1
]}

BUCKLEY, CJ ^{[1
]}

FOSTER, GF ^{[1
]}

机构：

[1] RUTHERFORD APPLETON LAB,CENT LASER FACIL,DIDCOT OX11 0QX,OXON,ENGLAND

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1993年 / 64卷 / 06期

关键词：

D O I：

10.1063/1.1144067

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Previously high-resolution soft x-ray microscopy has only been possible with synchrotron sources. Here, the first successful attempts at using a scanning transmission x-ray microscope with a laser-plasma source are reported. Spatial resolutions were limited to about 650 nm by electrical noise in the detector, but single shot per pixel images were obtained of test and real specimens. The microscope was not optimized to the source since it was designed for use on the undulator beam line of a synchrotron. With an improved system, it is demonstrated that single shot per pixel imaging at high resolution (better than 50 nm) will routinely be possible.

引用

页码：1478 / 1482

页数：5

共 11 条

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