LOW-TEMPERATURE MAGNETIC FORCE MICROSCOPY

被引：36

作者：

HUG, HJ

MOSER, A

JUNG, T

FRITZ, O

WADAS, A

PARASHIKOV, I

GUNTHERODT, HJ

机构：

[1] Institut für Physik, Universität Basel, CH-4056 Basel

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1993年 / 64卷 / 10期

关键词：

D O I：

10.1063/1.1144383

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

We have built a low temperature scanning force microscope which is able to measure contact and noncontact forces using the dc modes of force microscopy. We demonstrate the capabilities of our instrument on a magneto-optical disk at room temperature and at 77 K. Using a ferromagnetic thin film tip, the topography and the micromagnetic stray field of the sample is measured using the dc modes of force microscopy. The topographic and magnetic data are precisely correlated. The circular bit structure and the natural domain structure between the homogeneously magnetized bits is clearly visible. A lateral resolution below 100 nm and a force resolution of 10(-12) N is reproducibly achieved.

引用

页码：2920 / 2925

页数：6

共 14 条

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[9] A HIGH-STABILITY AND LOW DRIFT ATOMIC FORCE MICROSCOPE [J].

HUG, HJ ;

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REVIEW OF SCIENTIFIC INSTRUMENTS, 1992, 63 (08) :3900-3904

[10]

HUG HJ, UNPUB

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