APPLICATION OF TRANSMISSION ELECTRON-MICROSCOPY TO THE OBSERVATION OF DISLOCATION EMISSION FROM CRACK TIPS AT ELEVATED-TEMPERATURES

被引：3
作者：
CLARKE, DR
CHIAO, YH
机构：
来源：
ULTRAMICROSCOPY | 1989年 / 29卷 / 1-4期
关键词：
D O I：
10.1016/0304-3991(89)90247-7
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
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页码：203 / 211
页数：9
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