LOW-ENERGY ELECTRON-DIFFRACTION DETERMINATION OF STRUCTURE OF SUCCESSIVELY DEPOSITED ORDERED LAYERS OF CD ON TI(0001) .1. 1ST LAYER

被引：28
作者：
SHIH, HD
JONA, F
JEPSEN, DW
MARCUS, PM
机构：
[1] SUNY STONY BROOK,DEPT MAT SCI,STONY BROOK,NY 11794
[2] IBM CORP,RES CTR,YORKTOWN HTS,NY 10598
来源：
PHYSICAL REVIEW B | 1977年 / 15卷 / 12期
关键词：
D O I：
10.1103/PhysRevB.15.5550
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
收藏
页码：5550 / 5560
页数：11
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