ALPHAPHONE - METHOD FOR MEASURING THIN-FILM ABSORPTION AT LASER WAVELENGTHS

被引：25

作者：

KERR, EL ^{[1
]}

机构：

[1] PERKIN ELMER CORP,WILTON,CT 06897

来源：

APPLIED OPTICS | 1973年 / 12卷 / 10期

关键词：

D O I：

10.1364/AO.12.002520

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：2520 / 2527

页数：8

共 9 条

[1] DEUTSCH TF, 1973, DAAHO172C0194 CONTR
[2] FRADLIN DW, 1972, LASER INDUCED DAMAGE
[3] HELLWARTH RW, 1972, LASER INDUCED DAMAGE
[4] LASER ILLUMINATED ABSORPTIVITY SPECTROPHONE - A METHOD FOR MEASUREMENT OF WEAK ABSORPTIVITY IN GASES AT LASER WAVELENGTHS
KERR, EL
ATWOOD, JG
[J]. APPLIED OPTICS, 1968, 7 (05): : 915 - &
[5] KERR EL, 1970, INSTRUMENT NEWS, V21, P2
[6] ULTRALOW GAS CONCENTRATION INFRARED ABSORPTION SPECTROSCOPY
KREUZER, LB
[J]. JOURNAL OF APPLIED PHYSICS, 1971, 42 (07) : 2934 - &
[7] NITRIC OXIDE AIR POLLUTION - DETECTION BY OPTOACOUSTIC SPECTROSCOPY
KREUZER, LB
PATEL, CKN
[J]. SCIENCE, 1971, 173 (3991) : 45 - &
[8] SPARKS M, 1972, LASER INDUCED DAMAGE
[9] WIJNTJES G, 1972, LASER INDUCED DAMAGE