BALLISTIC ELECTRON-EMISSION MICROSCOPY AND SPECTROSCOPY OF AU/GAAS INTERFACES

被引：35
|
作者：
KAISER, WJ
BELL, LD
HECHT, MH
GRUNTHANER, FJ
机构：
来源：
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1989年 / 7卷 / 04期
关键词：
D O I：
10.1116/1.584585
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：945 / 949
页数：5
相关论文
共 50 条
  • [1] BALLISTIC ELECTRON-EMISSION MICROSCOPY OF SEMICONDUCTOR INTERFACES
    WILLIAMS, RH
    INSTITUTE OF PHYSICS CONFERENCE SERIES, 1991, (117): : 245 - 252
  • [2] BALLISTIC ELECTRON-EMISSION MICROSCOPY STUDIES OF AU-CDTE AND AU-GAAS INTERFACES AND BAND-STRUCTURE
    FOWELL, AE
    WILLIAMS, RH
    RICHARDSON, BE
    CAFOLLA, AA
    WESTWOOD, DI
    WOOLF, DA
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1991, 9 (02): : 581 - 584
  • [3] Ballistic Electron Emission Microscopy/Spectroscopy on Au/Titanylphthalocyanine/GaAs Heterostructures
    Oezcan, S.
    Roch, T.
    Strasser, G.
    Smoliner, J.
    Franke, R.
    Fritz, T.
    PROCEEDINGS OF THE INTERNATIONAL CONFERENCE ON NANOSCIENCE AND TECHNOLOGY, 2007, 61 : 1371 - 1374
  • [4] Ballistic electron emission microscopy and spectroscopy of the Au/GaAs(110) interface
    Stockman, L
    van Kempen, H
    SURFACE SCIENCE, 1998, 408 (1-3) : 232 - 236
  • [5] BALLISTIC ELECTRON-EMISSION MICROSCOPY OF METAL-SEMICONDUCTOR INTERFACES AND HETEROJUNCTIONS
    WILLIAMS, RH
    APPLIED SURFACE SCIENCE, 1993, 70-1 : 386 - 390
  • [6] Ballistic-electron-emission spectroscopy of Au/Si and Au/GaAs interfaces: Low-temperature measurements and ballistic models
    Guthrie, DK
    Harrell, LE
    Henderson, GN
    First, PN
    Gaylord, TK
    Glytsis, EN
    Leibenguth, RE
    PHYSICAL REVIEW B, 1996, 54 (23): : 16972 - 16982
  • [7] Ballistic-electron-emission spectroscopy of Au/Si and Au/GaAs interfaces: Low-temperature measurements and ballistic models
    Guthrie, D. K.
    Harrell, L. E.
    Henderson, G. N.
    First, P. N.
    Physical Review B: Condensed Matter, 54 (23):
  • [8] BALLISTIC ELECTRON-EMISSION IN SILICIDE SILICON INTERFACES
    HASEGAWA, Y
    KUK, Y
    TUNG, RT
    SILVERMAN, PJ
    SAKURAI, T
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1991, 9 (02): : 578 - 580
  • [9] BALLISTIC ELECTRON-EMISSION SPECTROSCOPY OF NOBLE METAL-GAP(110) INTERFACES
    LUDEKE, R
    PRIETSCH, M
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1991, 9 (03): : 885 - 890
  • [10] THE AU/CDTE INTERFACE - AN INVESTIGATION OF ELECTRICAL BARRIERS BY BALLISTIC ELECTRON-EMISSION MICROSCOPY
    FOWELL, AE
    WILLIAMS, RH
    RICHARDSON, BE
    SHEN, TH
    SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 1990, 5 (04) : 348 - 350
12345