CHARACTERIZATION OF THE CHROMIUM-OXYGEN BOUNDING STUDIED BY HIGH-RESOLUTION AUGER-ELECTRON SPECTROMETER

被引：0
作者：
JARDIN, C
GAUTHIER, JP
MICHEL, P
机构：
来源：
JOURNAL DE MICROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES | 1979年 / 4卷 / 01期
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：55 / 62
页数：8
相关论文
共 17 条
[1]  
ALLEN GC, 1977, J MICROSC SPECT ELEC, V2, P257
[2]   X-RAY PHOTOELECTRON-AUGER ELECTRON SPECTROSCOPIC STUDY OF INITIAL OXIDATION OF CHROMIUM METAL [J].
ALLEN, GC ;
TUCKER, PM ;
WILD, RK .
JOURNAL OF THE CHEMICAL SOCIETY-FARADAY TRANSACTIONS II, 1978, 74 :1126-1140
[3]   XPS AND AES STUDIES OF ANODIC PASSIVE FILMS GROWN ON CHROMIUM ELECTRODES IN SULFURIC-ACID BATHS [J].
BOUYSSOUX, G ;
ROMAND, M ;
POLASCHEGG, HD ;
CALOW, JT .
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1977, 11 (02) :185-196
[4]  
BUI MD, 1978, THESIS LYON
[5]  
BUI MD, 1979, J PHYS E, V12, P43
[6]   DOES AUGER PEAK OF OXYGEN BRING INFORMATION IN METAL OXIDATION STUDIES [J].
CARRIERE, B ;
DEVILLE, JP ;
MAIRE, G ;
LEGARE, P .
SURFACE SCIENCE, 1976, 58 (02) :618-620
[7]   CHEMICAL SHIFTS IN AUGER SPECTRA FROM OXIDISED CHROMIUM AND VANADIUM [J].
COAD, JP ;
RIVIERE, JC .
PHYSICS LETTERS A, 1971, A 35 (03) :185-&
[8]  
EKELUND S, 1973, SURF SCI, V40, P179, DOI 10.1016/0039-6028(73)90061-7
[9]   SOME PROBLEMS IN ANALYSIS OF AUGER ELECTRON SPECTRA [J].
HAAS, TW ;
GRANT, JT ;
DOOLEY, GJ .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1970, 7 (01) :43-&
[10]   OXIDATION OF CHROMIUM (111) SINGLE-CRYSTAL SURFACE [J].
JARDIN, C ;
MICHEL, P .
SURFACE SCIENCE, 1978, 71 (03) :575-582
12