ELECTRON-PROBE MICROANALYSIS APPLIED TO VERY THIN-LAYERS OF ALUMINUM-NICKEL ALLOYS

被引：5
作者：
DUZEVIC, D
BONEFACIC, A
机构：
来源：
X-RAY SPECTROMETRY | 1978年 / 7卷 / 03期
关键词：
D O I：
10.1002/xrs.1300070308
中图分类号：
O433 [光谱学];
学科分类号：
0703 ; 070302 ;
摘要：
引用
收藏
页码：152 / 155
页数：4
相关论文
共 8 条
[1]   PRESENT STATE OF QUANTITATIVE X-RAY MICROANALYSIS .2. COMPUTATIONAL METHODS [J].
ARCHARD, GD ;
MULVEY, T .
BRITISH JOURNAL OF APPLIED PHYSICS, 1963, 14 (10) :626-&
[2]  
BIRKS LS, 1963, ELECTRON PROBE MICRO
[3]  
DJURIC B, 1969, 5TH ICXOM TUB, P99
[4]  
DUZEVIC D, 1974, X-RAY SPECTROM, V3, P143
[5]   VAPOR-QUENCHED AL-NI ALLOY THIN-FILMS IN CONCENTRATION RANGE 12.5 TO 75.4 AT. PERCENT NI [J].
DUZEVIC, D .
SCRIPTA METALLURGICA, 1975, 9 (05) :543-546
[6]   ALUMINUM-RICH AL-NI ALLOYS RAPIDLY QUENCHED FROM VAPOR [J].
DUZEVIC, D ;
BONEFACIC, A ;
KUNSTELJ, D .
SCRIPTA METALLURGICA, 1973, 7 (08) :883-886
[7]  
HUTCHINS GA, 1966, ELECTRON MICROPROBE, P390
[8]  
PHILIBERT J, 1964, MET CORROS-IND, V40, P157
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