MAGNETIC DEPTH PROFILES OF MAGNETIC MULTILAYERS FE/SI AND FE/W USING POLARIZED NEUTRON REFLECTOMETRY

被引：2
|
作者：
HOMMA, H [1 ]
ANKER, JF [1 ]
MAJKRZAK, CF [1 ]
机构：
[1] NATL INST STAND & TECHNOL,DIV REACTOR RADIAT,GAITHERSBURG,MD 20899
来源：
JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS | 1993年 / 126卷 / 1-3期
关键词：
D O I：
10.1016/0304-8853(93)90595-S
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
We have studied the magnetic properties and roughness at interfaces of sputtered magnetic multilayers Fe/Si and Fe/W, employing a newly developed magnetic profile refinement program for polarized neutron reflectivity data. This modeling demonstrates the capability to measure magnetic moment depth profiles near interfaces quantitatively.
引用
收藏
页码：257 / 260
页数：4
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