PROTON MAGNETIC-RESONANCE SPECTRA OF PLASMA-DEPOSITED AMORPHOUS SI-H FILMS

被引：213

作者：

REIMER, JA ^{[1
]}

VAUGHAN, RW ^{[1
]}

KNIGHTS, JC ^{[1
]}

机构：

[1] XEROX CORP,PALO ALTO RES CTR,PALO ALTO,CA 94304

来源：

PHYSICAL REVIEW LETTERS | 1980年 / 44卷 / 03期

关键词：

D O I：

10.1103/PhysRevLett.44.193

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页码：193 / 196

页数：4

共 11 条

[1]

ABRAGAM A, 1961, PRINCIPLES NUCLEAR M

[2]

BRODSKY MH, 1977, PHYS REV B, V16, P3550

[3] SMALL-ANGLE-SCATTERING EVIDENCE OF VOIDS IN HYDROGENATED AMORPHOUS SILICON [J].

DANTONIO, P ;

KONNERT, JH .

PHYSICAL REVIEW LETTERS, 1979, 43 (16) :1161-1163

[4] MICROSTRUCTURE OF PLASMA-DEPOSITED A-SI-H FILMS [J].

KNIGHTS, JC ;

LUJAN, RA .

APPLIED PHYSICS LETTERS, 1979, 35 (03) :244-246

[5] DEFECTS IN PLASMA-DEPOSITED A-SI-H [J].

KNIGHTS, JC ;

LUCOVSKY, G ;

NEMANICH, RJ .

JOURNAL OF NON-CRYSTALLINE SOLIDS, 1979, 32 (1-3) :393-403

[6]

LEADBETTER AJ, UNPUBLISHED

[7] STRUCTURAL INTERPRETATION OF THE VIBRATIONAL-SPECTRA OF A-SI-H ALLOYS [J].

LUCOVSKY, G ;

NEMANICH, RJ ;

KNIGHTS, JC .

PHYSICAL REVIEW B, 1979, 19 (04) :2064-2073

[8] UTILITY OF MULTIPLE-PULSE NMR TO DETERMINE AMORPHOUS FRACTION OF POLYETHYLENE [J].

PEMBLETON, RG ;

WILSON, RC ;

GERSTEIN, BC .

JOURNAL OF CHEMICAL PHYSICS, 1977, 66 (11) :5133-5136

[9] ANALYSIS OF MULTIPLE PULSE NMR IN SOLIDS .2. [J].

RHIM, WK ;

ELLEMAN, DD ;

SCHREIBER, LB ;

VAUGHAN, RW .

JOURNAL OF CHEMICAL PHYSICS, 1974, 60 (11) :4595-4604

[10] LUMINESCENCE STUDIES OF PLASMA-DEPOSITED HYDROGENATED SILICON [J].

STREET, RA ;

KNIGHTS, JC ;

BIEGELSEN, DK .

PHYSICAL REVIEW B, 1978, 18 (04) :1880-1891

← 1 2 →