EFFECTS OF INTERMETALLIC FORMATION AT THE INTERFACE BETWEEN COPPER AND LEAD TIN SOLDER

被引:79
作者
PARENT, JOG
CHUNG, DDL
BERNSTEIN, IM
机构
[1] Carnegie Mellon Univ, United States
关键词
Bond Strength - Lead Tin Solder - Soldered Joints;
D O I
10.1007/BF01111916
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
(Edited Abstract)
引用
收藏
页码:2564 / 2572
页数:9
相关论文
共 20 条
[1]  
BADER WG, 1969, WELD J, V48, pS551
[2]  
Berg H., 1973, P 11 RELIABILITY PHY, P10
[3]  
BLICKENSDERFER R, 1984, J TEST EVAL, V12, P3, DOI 10.1520/JTE11414J
[4]  
DEHAVEN PW, 1984, IBMEF52 INT REP
[5]  
DEHAVEN PW, 1983, ADV XRAY ANAL, V27
[6]  
FIDOS H, 1970, Z METALLKD, V61, P225
[7]  
HAGSTROM RA, 1969, P TECHNICAL PROGRAMM, P271
[8]   GROWTH-KINETICS OF INTERMETALLIC PHASES AT THE LIQUID SN AND SOLID NI INTERFACE [J].
KANG, SK ;
RAMACHANDRAN, V .
SCRIPTA METALLURGICA, 1980, 14 (04) :421-424
[9]   SOLDERING EXTERNAL CONNECTIONS TO THIN-FILM SYSTEMS [J].
KELLER, HN ;
MORABITO, JM .
SURFACE AND INTERFACE ANALYSIS, 1981, 3 (01) :16-22
[10]  
MEISSNER HP, 1951, T ASME, V73, P697