Surface Electrical Conductivity Measurement System with Micro-Four-Point Probes at Sub-Kelvin Temperature under High Magnetic Field in Ultrahigh Vacuum

被引：26

作者：

Yamada, Manabu ^{[1
]}

Hirahara, Toru ^{[1
]}

Hobara, Rei ^{[1
]}

Hasegawa, Shuji ^{[1
]}

Mizuno, Hiroyuki ^{[2
]}

Miyatake, Yutaka ^{[2
]}

Nagamura, Toshihiko ^{[2
]}

机构：

[1] Univ Tokyo, Grad Sch Sci, Dept Phys, Bunkyo Ku, Hongo 7-3-1, Tokyo 1130033, Japan

[2] UNISOKU Co Ltd, Hirakata, Osaka 5730131, Japan

来源：

E-JOURNAL OF SURFACE SCIENCE AND NANOTECHNOLOGY | 2012年 / 10卷

基金：

日本学术振兴会;

关键词：

Surface-state superconductivity; Micro-four-point probe; Surface electrical transport; Dual configuration method; In; Si(111);

D O I：

10.1380/ejssnt.2012.400

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

We have constructed an ultrahigh vacuum system in which surface conductivity is measured in situ by micro four -point probe method down to 0.8 K, combined with conventional surface preparation/analysis capability. In order to reduce the data scattering due to changes of the probe spacing, we have employed a dual configuration method in which the combinations with current/voltage probes are switched. The surface-state superconductivity of Si(111)-\/77 x '0-In surface superstructure was confirmed with the critical temperature of 2.8 K. The critical magnetic field was 0.3-0.4 T in the surface-normal direction.

引用

页码：400 / 405

页数：6

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