共 29 条
[1]
DETERMINATION AND OBSERVATION OF ELECTRONIC DEFECT LEVELS IN CULNSE2 CRYSTALS AND THIN-FILMS
[J].
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS,
1991, 9 (03)
:554-558
[3]
Fagen E. A., 1970, Journal of Non-Crystalline Solids, V4, P480, DOI 10.1016/0022-3093(70)90083-9
[4]
RECOMBINATION IN AMORPHOUS ARSENIC TRISELENIDE
[J].
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH,
1974, 24 (01)
:275-283
[5]
FUHS W, 1968, PHYS STATUS SOLIDI A, V24, P271
[8]
GOYAL N, THESIS
[9]
GOYAL N, 1993, J PHYS, V70, P97
[10]
TRAPPING OF MINORITY CARRIERS IN SILICON .1. P-TYPE SILICON
[J].
PHYSICAL REVIEW,
1955, 97 (02)
:311-321