MEASUREMENT OF REFLECTANCE BY GAS IONIZATION

被引：11
|
作者：
BIRKHOFF, RD [1 ]
PAINTER, LR [1 ]
HELLER, JM [1 ]
机构：
[1] UNIV TENNESSEE,DEPT PHYS,KNOXVILLE,TN 37916
来源：
APPLIED OPTICS | 1977年 / 16卷 / 09期
关键词：
D O I：
10.1364/AO.16.002576
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
引用
收藏
页码：2576 / 2579
页数：4
相关论文
共 50 条
  • [41] METHODS OF PUMPING SPEED AND GAS-RELEASE MEASUREMENT IN IONIZATION GAUGE HEADS - A REVIEW
    BERMAN, A
    VACUUM, 1982, 32 (08) : 497 - 508
  • [42] MEASUREMENT OF IONIZATION AND ATTACHMENT COEFFICIENTS IN DIFLUORODICHLOROMETHANE AND SF6 GAS-MIXTURES
    QIU, Y
    WENG, X
    JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1987, 20 (09) : 1203 - 1204
  • [43] IONIZATION OF INFALLING GAS
    Haffner, L. M.
    Duncan, A. K.
    Hoffman, S. M.
    Madsen, G. J.
    Hill, A. S.
    Reynolds, R. J.
    ROLE OF THE DISK-HALO INTERACTION IN GALAXY EVOLUTION: OUTFLOWS VS INFALL?, 2012, 56 : 319 - +
  • [44] IONIZATION OF GAS BY ELECTRONS
    KNIPP, JK
    EGUCHI, T
    OHTA, M
    NAGATA, S
    PROGRESS OF THEORETICAL PHYSICS, 1953, 10 (01): : 24 - 30
  • [45] Remote measurement of surface roughness, surface reflectance, and body reflectance with LiDAR
    Li, Xiaolu
    Liang, Yu
    APPLIED OPTICS, 2015, 54 (30) : 8904 - 8912
  • [46] EFFECT OF COMPARISON SOURCE REFLECTANCE ON GAS TEMPERATURE-MEASUREMENT BY KURLBAUMS METHOD AND LINE REVERSAL METHODS
    GREENWOO.SW
    JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1973, 6 (08): : 693 - 694
  • [47] ABSOLUTE REFLECTANCE MEASUREMENT AT NORMAL INCIDENCE
    RAM, RS
    PRAKASH, O
    SINGH, J
    VARMA, SP
    OPTICS AND LASER TECHNOLOGY, 1990, 22 (01): : 51 - 55
  • [48] Display reflectance: Basics, measurement, and rating
    Becker, Michael E.
    JOURNAL OF THE SOCIETY FOR INFORMATION DISPLAY, 2006, 14 (10-12) : 1003 - 1017
  • [49] Oil viscosity measurement by ultrasonic reflectance
    Saggin, R.
    Coupland, J.N.
    1600, American Oil Chemists' Society (78):
  • [50] Design of conjugated reflectometer for reflectance measurement
    Wu L.-X.
    Wang L.-J.
    Lin X.-W.
    Liu F.
    Guangxue Jingmi Gongcheng/Optics and Precision Engineering, 2010, 18 (12): : 2521 - 2529
12345