Assessment for applicability of the "tangent technique" in X-ray small-angle scattering

被引:0
作者
Smirnov, A. V. [1 ]
Kalyakin, V. Yu. [1 ]
Fedorov, B. A. [1 ]
机构
[1] ITMO Univ, 49 Kronverkskiy, St Petersburg 197101, Russia
来源
NANOSYSTEMS-PHYSICS CHEMISTRY MATHEMATICS | 2016年 / 7卷 / 06期
关键词
small-angle X-ray scattering; size distribution of nanoparticles; Guinier plot;
D O I
10.17586/2220-8054-2016-7-6-1002-1009
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
A number of simple model systems are used to examine the applicability of the "tangent technique", employed in the small-angle X-ray scattering for estimating the particle size distribution function, as well as to ascertain the relative contributions of the scattering intensity by differently sized particles to the total scattering intensity. The undertaken analysis has shown that, even in the most favorable case-an ensemble of two groups of different-size particles-the "tangent technique" cannot be used either to find the particle size proper, or to ascertain the relative contributions of individual groups to the total scattering intensity.
引用
收藏
页码:1002 / 1009
页数:8
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