MORPHOLOGY OF SI-SIO2 INTERFACE

被引：32
作者：
SUGANO, T
CHEN, JJ
HAMANO, T
机构：
来源：
SURFACE SCIENCE | 1980年 / 98卷 / 1-3期
关键词：
D O I：
10.1016/0039-6028(80)90487-2
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
引用
收藏
页码：154 / 166
页数：13
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