MORPHOLOGY OF SI-SIO2 INTERFACE

被引：32

作者：

SUGANO, T

CHEN, JJ

HAMANO, T

机构：

来源：

SURFACE SCIENCE | 1980年 / 98卷 / 1-3期

关键词：

D O I：

10.1016/0039-6028(80)90487-2

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

收藏

页码：154 / 166

页数：13

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