TEMPERATURE-DEPENDENCE OF LOW-FREQUENCY ELECTRICAL NOISE IN SILICON RESISTORS

被引：5
|
作者：
JONES, BK
机构：
来源：
JOURNAL OF PHYSICS D-APPLIED PHYSICS | 1981年 / 14卷 / 03期
关键词：
D O I：
10.1088/0022-3727/14/3/017
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
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页码：471 / 490
页数：20
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