DETERMINATION OF CONTAMINANTS IN HIGH-PURITY SILICON BY NONDESTRUCTIVE ACTIVATION ANALYSIS

被引：0
作者：
BOGANCH, Y
KVITTNER, P
SABO, E
机构：
来源：
SOVIET ATOMIC ENERGY | 1968年 / 24卷 / 05期
关键词：
D O I：
10.1007/BF01163517
中图分类号：
TL [原子能技术]; O571 [原子核物理学];
学科分类号：
0827 ; 082701 ;
摘要：
A method was developed for mass neutron-activation analysis (without chemical decomposition) of highpurity silicon. Gamma spectra from samples which were irradiated for 24-48 h in a thermal neutron flux of 1013 n/cm2-sec, and which were held for 24-72h, were obtained with a scintillation detector and multichannel analyzer. The gamma spectra were analyzed on a computer by the least-squares method. The following contaminants were found: Cu, As, Sb, Na, Au, W, and P. © 1968 Consultants Bureau.
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页码：520 / &
相关论文
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  • [2] CALI JP, 1964, TRACE ANALYSIS SEMIC
  • [3] KVITTNER P, 1967, NUCL INSTR METHODS, V51, P273
  • [4] PARR R, 1964, NS113, P349
  • [5] SALMON L, 1961, NUCL INSTRUM METHODS, V14, P193
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