ION INDUCED SECONDARY-ELECTRON EMISSION AS A PROBE FOR ADSORBED OXYGEN ON TUNGSTEN

被引：12
|
作者：
HASSELKAMP, D
SCHARMANN, A
STILLER, N
机构：
来源：
NUCLEAR INSTRUMENTS & METHODS | 1980年 / 168卷 / 1-3期
关键词：
D O I：
10.1016/0029-554X(80)91313-0
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
引用
收藏
页码：579 / 583
页数：5
相关论文
共 50 条
  • [21] INVESTIGATION OF SECONDARY-ELECTRON ENERGY-SPECTRA AT CONTROLLABLE SECONDARY-ELECTRON EMISSION
    KAVALOV, RL
    MARGARYAN, YL
    PAPYAN, GA
    RADIOTEKHNIKA I ELEKTRONIKA, 1985, 30 (11): : 2229 - 2233
  • [22] Secondary-electron emission of ion-implanted semiconductors in scanning electron microscopy
    Nshanian, T.
    Applied Physics A: Solids and Surfaces, 1994, 59 (04): : 349 - 355
  • [23] SECONDARY-ELECTRON EMISSION FROM SOLIDS .1. SECONDARY-ELECTRON SPECTROSCOPY
    CAILLER, M
    GANACHAUD, JP
    SCANNING MICROSCOPY, 1990, : 57 - 79
  • [24] SECONDARY-ELECTRON EMISSION FROM ALUMINUM BY ARGON AND OXYGEN ION-BOMBARDMENT BELOW 3 KEV
    YAMAUCHI, Y
    SHIMIZU, R
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1983, 22 (04): : L227 - L229
  • [25] HEAVY-ION INDUCED SECONDARY-ELECTRON EMISSION - POSSIBLE METHOD FOR Z-IDENTIFICATION
    CLERC, HG
    GEHRHARD.HJ
    RICHTER, L
    SCHMIDT, KH
    NUCLEAR INSTRUMENTS & METHODS, 1973, 113 (03): : 325 - 331
  • [26] INVESTIGATION OF OXYGEN ADSORPTION ON TUNGSTEN BY SECONDARY ION-ION EMISSION
    RYBALKO, VF
    KOLOT, BY
    FOGEL, YM
    SOVIET PHYSICS TECHNICAL PHYSICS-USSR, 1970, 14 (09): : 1290 - +
  • [27] SECONDARY-ELECTRON EMISSION OF SEMICONDUCTING GLASSES
    DUNN, B
    OOKA, K
    MACKENZIE, JD
    JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 1973, 56 (09) : 494 - 494
  • [28] SECONDARY-ELECTRON EMISSION FOR MATERIAL DIAGNOSTICS
    TOMASHPOLSKII, YY
    INDUSTRIAL LABORATORY, 1992, 58 (02): : 146 - 153
  • [29] SECONDARY-ELECTRON EMISSION FROM METAL-SURFACES BY ION IMPACT
    KANEKO, T
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1992, 67 (1-4): : 655 - 658
  • [30] Photon-induced anion emission: A mechanism for ion-induced secondary-electron emission from an Al/O surface
    Walton, SG
    Peko, BL
    Champion, RL
    PHYSICAL REVIEW B, 1998, 58 (23): : 15430 - 15432
12345