METHOD FOR THE STUDY OF LATTICE INHOMOGENEITIES COMBINING X-RAY MICROSCOPY AND DIFFRACTION ANALYSIS

被引：36
作者：
WEISSMANN, S
机构：
来源：
JOURNAL OF APPLIED PHYSICS | 1956年 / 27卷 / 04期
关键词：
D O I：
10.1063/1.1722382
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
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页码：389 / 395
页数：7
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