ELECTRON-SPECTROSCOPY FOR DIAGNOSTICS OF VARIOUS SOLID CARBON PHASES

被引：7
作者：
SHIKIN, AM
PRUDNIKOVA, GV
ADAMCHUK, VK
机构：
[1] Institute of Physics, St.-Petersburg State University, St.-Petersburg
来源：
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA | 1994年 / 68卷
关键词：
D O I：
10.1016/0368-2048(94)02158-9
中图分类号：
O433 [光谱学];
学科分类号：
0703 ; 070302 ;
摘要：
Comparative investigation of the peculiarities of the C(KVV) Auger and energy loss spectra for surfaces of the (0001) graphite, (111) diamond and vacuum deposited C60 -film was performed. ELS spectra can be mainly characterized by the specific plasma resonances which have different energy depending on the structure of the carbon phases. The features of the C(KVV) Auger line are also related to the loss resonances and diverse for different carbon modifications. It is concluded that the observed features of ELS and AES spectra can serve for detection of various carbon-based systems. It has been applied to the analysis of quality and phase state of various carbon-based films.
引用
收藏
页码：413 / 418
页数：6
相关论文
共 50 条
[21]   ANISOTROPIC EMISSION IN ELECTRON-SPECTROSCOPY [J].
BAUDOING, R ;
GAUBERT, C ;
BLANC, E ;
ABERDAM, D ;
GAUTHIER, Y .
SCANNING ELECTRON MICROSCOPY, 1984, :87-102
[22]   ELECTRON-SPECTROSCOPY - ULTRAVIOLET EXCITATION [J].
BAKER, AD ;
BRISK, MA ;
LIOTTA, DC .
ANALYTICAL CHEMISTRY, 1976, 48 (05) :R281-R294
[23]   RESONANT TUNNELING ELECTRON-SPECTROSCOPY [J].
CAPASSO, F ;
SEN, S ;
CHO, AY ;
HUTCHINSON, AL .
ELECTRONICS LETTERS, 1987, 23 (01) :28-29
[24]   ELASTIC PEAK ELECTRON-SPECTROSCOPY [J].
GERGELY, G .
SCANNING, 1986, 8 (05) :203-214
[25]   ELECTRON-SPECTROSCOPY OF PLANETARY ATOMS [J].
SENG, M ;
HALKA, M ;
HEBER, KD ;
SANDNER, W .
PHYSICAL REVIEW LETTERS, 1995, 74 (17) :3344-3347
[26]   COMMENTARY ON ELECTRON-SPECTROSCOPY AND KINETICS [J].
ELEY, DD .
PHILOSOPHICAL TRANSACTIONS OF THE ROYAL SOCIETY A-MATHEMATICAL PHYSICAL AND ENGINEERING SCIENCES, 1986, 318 (1541) :117-120
[27]   ELECTRON-SPECTROSCOPY OF THE DIAMOND SURFACE [J].
PEPPER, SV .
APPLIED PHYSICS LETTERS, 1981, 38 (05) :344-346
[28]   ELECTRON-SPECTROSCOPY OF POROUS SILICON LAYERS INDIRECT DETECTION OF HYDROGEN BY ELASTIC PEAK ELECTRON-SPECTROSCOPY [J].
GERGELY, G ;
GRUZZA, B ;
BIDEUX, L ;
BONDOT, P ;
JARDIN, C ;
VAZSONYI, E .
SURFACE AND INTERFACE ANALYSIS, 1994, 22 (1-12) :271-274
[29]   EXPERIMENTAL SELF-ENERGY CORRECTIONS FOR VARIOUS SEMICONDUCTORS DETERMINED BY ELECTRON-SPECTROSCOPY [J].
JACKSON, WB ;
ALLEN, JW .
PHYSICAL REVIEW B, 1988, 37 (09) :4618-4633
[30]   ELECTRON-SPECTROSCOPY IN THE SCANNING ELECTRON-MICROSCOPE [J].
SEILER, H .
ULTRAMICROSCOPY, 1985, 17 (01) :1-8
12345