ABUNDANCE AND DEPTH OF ORIGIN OF NEUTRAL AND IONIC CLUSTERS SPUTTERED FROM A LIQUID GALLIUM-INDIUM EUTECTIC ALLOY

被引：21

作者：

LILL, TB

CALLAWAY, WF

PELLIN, MJ

GRUEN, DM

机构：

[1] ARGONNE NATL LAB,DIV CHEM TECHNOL,ARGONNE,IL 60439

[2] ARGONNE NATL LAB,DIV CHEM,ARGONNE,IL 60439

来源：

PHYSICAL REVIEW LETTERS | 1994年 / 73卷 / 12期

关键词：

D O I：

10.1103/PhysRevLett.73.1719

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

Neutral and positively charged clusters produced by 4 keV Ar+ ion bombardment of a liquid gallium-indium eutectic alloy have been studied by time-of-flight mass spectrometry coupled with single photon postionization of the neutrals. The abundance distributions for clusters with equal nuclearity are statistical. They confirm a strong indium surface segregation. An increasing gallium content, and therefore, larger depth of origin, was found for increasing cluster size.

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页码：1719 / 1722

页数：4

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