SPREADING RESISTANCE AND 1-F NOISE OF EMBEDDED ELLIPSOIDAL ELECTRODES IN A CONDUCTOR

被引：6
作者：
COPPUS, GWM
VANDAMME, LKJ
机构：
[1] Department of Electrical Engineering, Eindhoven University of Technology, Eindhoven
来源：
APPLIED PHYSICS | 1979年 / 20卷 / 02期
关键词：
41.10.D1; 72.70.+m; 85.20.Sn;
D O I：
10.1007/BF00885931
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
Results of calculations for the spreading resistance and the resistance fluctuations due to 1/f conductivity fluctuations are presented. The resistor consists of a conducting medium between a small embedded ellipsoidal electrode and a large electrode at a large distance from the small one. The resistance and resistance fluctuations are compared with the simple results for an embedded hemispherical electrode. The results are presented graphically and can be used for ohmic contacts on semiconductors or for embedded ellipsoidal electrodes in an ionic solution. © 1979 Springer-Verlag.
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页码：119 / 123
页数：5
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