LOW-FREQUENCY NOISE AND DISCRETE CHARGE TRAPPING IN SMALL-AREA TUNNEL JUNCTION DC SQUIDS

被引：55

作者：

WAKAI, RT ^{[1
]}

VANHARLINGEN, DJ ^{[1
]}

机构：

[1] UNIV ILLINOIS,MAT RES LAB,URBANA,IL 61801

来源：

APPLIED PHYSICS LETTERS | 1986年 / 49卷 / 10期

关键词：

D O I：

10.1063/1.97051

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：593 / 595

页数：3

共 12 条

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[5]

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[7] NATURE OF SINGLE-LOCALIZED-ELECTRON STATES DERIVED FROM TUNNELING MEASUREMENTS [J].

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[8]

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[9] PARAMETER FLUCTUATIONS AND LOW-FREQUENCY NOISE IN JOSEPHSON JUNCTION DEVICES [J].

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[10]

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