FREQUENCY-DEPENDENCE OF ELECTRODE SURFACE EFFECTS IN PARALLEL-PLATE CAPACITORS

被引:16
|
作者
INGLIS, BD [1 ]
机构
[1] CSIRO,NATL MEASUREMENT LAB,UNIV GROUNDS,CITY RD,CHIPPENDALE 2008,NEW S WALES,AUSTRALIA
关键词
D O I
10.1109/TIM.1975.4314394
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:133 / 150
页数:18
相关论文
共 50 条
  • [1] SURFACE-DEFECTS IN PARALLEL-PLATE CAPACITORS
    SLOGGETT, GJ
    BARTON, NG
    JOURNAL OF PHYSICS A-MATHEMATICAL AND GENERAL, 1988, 21 (19): : 3695 - 3702
  • [2] FORM AND CAPICITANCE OF PARALLEL-PLATE CAPACITORS
    NISHIYAM, AH
    NAKAMURA, M
    IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY PART A, 1994, 17 (03): : 477 - 484
  • [3] Edge corrections for parallel-plate capacitors
    Yariv, Ehud
    EUROPEAN JOURNAL OF APPLIED MATHEMATICS, 2021, 32 (02) : 226 - 241
  • [4] The influence of surface topography on the electromechanical characteristics of parallel-plate MEMS capacitors
    Kogut, L
    JOURNAL OF MICROMECHANICS AND MICROENGINEERING, 2005, 15 (05) : 1068 - 1075
  • [5] FRINGING FIELD OF FINITE PARALLEL-PLATE CAPACITORS
    PILLAI, KPP
    PROCEEDINGS OF THE INSTITUTION OF ELECTRICAL ENGINEERS-LONDON, 1970, 117 (06): : 1201 - &
  • [6] Ferroelectric parallel-plate capacitors with copper electrodes for high-frequency applications
    Riekkinen, Tommi
    Mattila, Tomi
    van Dijken, Sebastiaan
    Lueker, A.
    Zhang, Qi
    Kirby, Paul B.
    Sanchez, Ana M.
    APPLIED PHYSICS LETTERS, 2007, 91 (25)
  • [7] Analysis of dielectric breakdown patterns in parallel-plate capacitors
    Sheu, CR
    Cheng, CY
    Wang, PS
    Lee, CY
    Pan, RP
    CHINESE JOURNAL OF PHYSICS, 2000, 38 (03) : 461 - 470
  • [9] FREE-SURFACE EFFECTS IN TORSIONAL PARALLEL-PLATE RHEOMETRY
    SHIPMAN, RWG
    DENN, MM
    KEUNINGS, R
    INDUSTRIAL & ENGINEERING CHEMISTRY RESEARCH, 1991, 30 (05) : 918 - 922
  • [10] Effects of the Particle Size and the Solvent in Printing Inks on the Capacitance of Printed Parallel-Plate Capacitors
    Park, Sungsik
    Lee, Dongjin
    ELECTRONICS, 2016, 5 (01):