THE EFFECT OF PLATINUM DIFFUSION AND ANNEALING ON BREAKDOWN VOLTAGES AND LIFETIMES OF BORON AND ALUMINUM-DOPED HIGH-VOLTAGE DIODES

被引：0
|
作者：
HAYES, AV
LIVSCHULTZ, M
KNOWLES, TJ
机构：
[1] UNISYS CORP,DEF SYST,GREAT NECK,NY 11020
[2] ZENITH ELECTR CORP,GLENVIEW,IL 60025
来源：
JOURNAL OF THE ELECTROCHEMICAL SOCIETY | 1987年 / 134卷 / 03期
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D O I：
暂无
中图分类号：
O646 [电化学、电解、磁化学];
学科分类号：
081704 ;
摘要：
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页码：C113 / C113
页数：1
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