ELECTRONIC SUPERPOSITION OF SAMPLE CURRENT AND SECONDARY-ELECTRON IMAGES IN AUGER-ELECTRON SPECTROSCOPY

被引：7
作者：
MORABITO, JM
MUNRO, DF
机构：
来源：
APPLIED PHYSICS LETTERS | 1972年 / 21卷 / 12期
关键词：
D O I：
10.1063/1.1654261
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
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页码：572 / &
相关论文
共 12 条
[1]  
BRANDIS EK, 1972, 7 P NAT C EL AN SAN
[2]  
MacDonald N. C., 1970, Applied Physics Letters, V16, P76, DOI 10.1063/1.1653107
[3]  
MACDONALD NC, 1971, APPL PHYS L, V19, P9
[4]   IN-DEPTH PROFILES OF PHOSPHORUS ION-IMPLANTED SILICON BY AUGER SPECTROSCOPY AND SECONDARY ION EMISSION [J].
MORABITO, JM ;
TSAI, JC .
SURFACE SCIENCE, 1972, 33 (02) :422-&
[5]  
MORABITO JM, 1971, 10 NAT M SOC APPL SP
[6]  
MORABITO JM, 1972, 7 P NAT C EL PROB AN
[7]  
MORABITO JM, 1972, 10 P ANN VAR VAC TEC
[8]  
MORABITO JM, TO BE PUBLISHED
[9]  
PALMBERG PW, 1972, ELECTRON SPECTROSCOP, P85
[10]  
TAYLOR NJ, PRIVATE COMMUNICATIO
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