DESIGN OF TOTALLY SELF-CHECKING CHECK CIRCUITS FOR M-OUT-OF-N CODES

被引：240
|
作者：
ANDERSON, DA
METZE, G
机构：
[1] BELL TEL LABS INC,INDIAN HILL,IL 60540
[2] UNIV ILLINOIS,COORDINATED SCI LAB,URBANA,IL 61801
来源：
IEEE TRANSACTIONS ON COMPUTERS | 1973年 / C 22卷 / 03期
关键词：
D O I：
10.1109/T-C.1973.223705
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
引用
收藏
页码：263 / 269
页数：7
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