MEAN FREE-PATH OF PHOTO-ELECTRONS IN SILICON AND SILICON-OXIDES

被引：21
作者：
BECHSTEDT, F [1 ]
HUBNER, K [1 ]
机构：
[1] WILHELM PIECK UNIV,SEKT PHYS,DDR-2500 ROSTOCK,GER DEM REP
来源：
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1981年 / 67卷 / 02期
关键词：
D O I：
10.1002/pssa.2210670221
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
收藏
页码：517 / 526
页数：10
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