共 11 条
[1]
Chatterjee P., 1986, International Electron Devices Meeting 1986. Technical Digest (Cat. No.86CH2381-2), P128
[3]
HASEGAWA N, 1987, 34TH SPR M JAP SOC A, P434
[4]
KAGA T, 1987, 19TH C SSDM, P15
[5]
KIMURA S, 1987, 19TH C SOL STAT DEV, P19
[6]
KOYANAGI M, 1978, IEDM, P348
[7]
Ohji Y., 1987, 25th Annual Proceedings: Reliability Physics 1987 (Cat. No.87CH2388-7), P55, DOI 10.1109/IRPS.1987.362155
[9]
TAKEMAE Y, 1985, ISSCC, P250
[10]
TAKEUCHI K, 1987, S VLSI TECHNOL, P99