共 50 条
- [41] ADSORPTION OF NICKEL ON MOLYBDENUM IN THE FIELD EMISSION MICROSCOPEJOURNAL OF CHEMICAL PHYSICS, 1957, 27 (03) : 646 - 652MCIRVINE, ECBRADLEY, RC
- [42] SCANNING TUNNELING MICROSCOPE EQUIPPED WITH A FIELD-ION MICROSCOPEJOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1989, 7 (03): : 1684 - 1688SAKURAI, THASHIZUME, TKAMIYA, IHASEGAWA, YIDE, TMIYAO, MSUMITA, ISAKAI, AHYODO, S
- [43] FIELD PENETRATION INTO SEMICONDUCTORS IN THE FIELD-ION MICROSCOPESURFACE SCIENCE, 1979, 85 (02) : 302 - 308ERNST, L
- [44] IMAGING GAS-ADSORPTION IN THE FIELD-ION MICROSCOPE - DEPENDENCE IN TIP FIELD-STRENGTH AND TIP TEMPERATUREJOURNAL DE PHYSIQUE, 1988, 49 (C-6): : 99 - 104DECASTILHO, CMCKINGHAM, DR
- [45] FIELD-EVAPORATION OF TUNGSTEN IN FIELD ION MICROSCOPEJAPANESE JOURNAL OF APPLIED PHYSICS, 1968, 7 (10) : 1202 - &TAMAKI, SKURODA, T
- [46] A COMBINED FIELD ELECTRON AND FIELD-ION MICROSCOPEJOURNAL DE PHYSIQUE, 1984, 45 (NC9): : 293 - 296ERNST, NEHRLICH, G
- [47] Atomic force microscope studies of fibrinogen adsorptionANALYST, 2010, 135 (06) : 1201 - 1209Averett, Laurel E.Schoenfisch, Mark H.
- [48] QUANTITATIVE ATOM-PROBE AND FIELD-ION MICROSCOPE STUDIES AT ATOMIC RESOLUTIONCHEMICA SCRIPTA, 1979, 14 (1-5): : 7 - 15TSONG, TT
- [49] FIELD-ION MICROSCOPE STUDIES OF ATOMIC DISPLACEMENT PROCESSES ON METAL-SURFACESVIDE-SCIENCE TECHNIQUE ET APPLICATIONS, 1975, 30 (176): : 39 - 43BASSETT, DWCHUNG, CKTICE, D
- [50] PHYS 579-Computational studies of ion hydrationABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2007, 233Leontis, Neocles B.