MOS INTEGRATED-CIRCUIT RELIABILITY

被引：16
|
作者：
SCHNABLE, GL
SCHLEGEL, ES
EWALD, HJ
机构：
来源：
IEEE TRANSACTIONS ON RELIABILITY | 1972年 / R 21卷 / 01期
关键词：
D O I：
10.1109/TR.1972.5216165
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
引用
收藏
页码：12 / &
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