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- [21] RESPONSE OF AN MOS INTEGRATED-CIRCUIT TO TESTS AT ELEVATED AMBIENT-TEMPERATURES PROCEEDINGS OF THE INSTITUTION OF ELECTRICAL ENGINEERS-LONDON, 1974, 121 (09): : 913 - 919
- [23] DIGITAL AND ANALOG INTEGRATED-CIRCUIT DESIGN WITH BUILT-IN RELIABILITY PROCEEDINGS - IEEE INTERNATIONAL CONFERENCE ON COMPUTER DESIGN : VLSI IN COMPUTERS & PROCESSORS, 1989, : 496 - 499
- [28] INTEGRATED-CIRCUIT TECHNIQUES IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS, 1984, 31 (01): : 49 - 63