MOS INTEGRATED-CIRCUIT RELIABILITY

被引：16

|

作者：

SCHNABLE, GL

SCHLEGEL, ES

EWALD, HJ

机构：

来源：

IEEE TRANSACTIONS ON RELIABILITY | 1972年 / R 21卷 / 01期

关键词：

D O I：

10.1109/TR.1972.5216165

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

引用

收藏

页码：12 / &

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