ATOM PROBE FIELD-ION MICROSCOPY OF A FENIB GLASS

被引：127
|
作者：
PILLER, J
HAASEN, P
机构：
来源：
ACTA METALLURGICA | 1982年 / 30卷 / 01期
关键词：
D O I：
10.1016/0001-6160(82)90038-4
中图分类号：
TF [冶金工业];
学科分类号：
0806 ;
摘要：
引用
收藏
页码：1 / 8
页数：8
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