TEM INVESTIGATION OF GA AND IN DOPED ZNS, AND IN DOPED ZNSE

被引:4
作者
LOGINOV, YY [1 ]
BROWN, PD [1 ]
THOMPSON, N [1 ]
RUSSELL, GJ [1 ]
WOODS, J [1 ]
机构
[1] UNIV DURHAM,SCH ENGN & APPL SCI,APPL PHYS GRP,DURHAM DH1 3LE,ENGLAND
关键词
D O I
10.1016/0022-0248(90)90849-G
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
Crystals of In and Ga doped ZnS and In doped ZnSe have been grown from the vapour phase. As-grown and vacuum annealed samples exhibited a well formed defect microstructure consisting of dislocations and stacking faults, whereas samples annealed in a zinc ambient were characterised by precipitates decorating and disrupting the native defect structure, and dislocation loops. © 1990.
引用
收藏
页码:827 / 840
页数:14
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