ATOMIC LAYER EPITAXY OF DEVICE QUALITY GAAS

被引:22
作者
COLAS, E [1 ]
BHAT, R [1 ]
SKROMME, BJ [1 ]
NIHOUS, GC [1 ]
机构
[1] PACIFIC INT CTR HIGH TECHNOL RES,HONOLULU,HI 96826
关键词
D O I
10.1063/1.101949
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:2769 / 2771
页数:3
相关论文
共 15 条
[1]   KINETIC LIMITS OF MONOLAYER GROWTH ON (001) GAAS BY ORGANOMETALLIC CHEMICAL-VAPOR DEPOSITION [J].
ASPNES, DE ;
COLAS, E ;
STUDNA, AA ;
BHAT, R ;
KOZA, MA ;
KERAMIDAS, VG .
PHYSICAL REVIEW LETTERS, 1988, 61 (24) :2782-2785
[2]   ATOMIC LAYER EPITAXY GROWN HETEROJUNCTION BIPOLAR-TRANSISTOR HAVING A CARBON-DOPED BASE [J].
BHAT, R ;
HAYES, JR ;
COLAS, E ;
ESAGUI, R .
IEEE ELECTRON DEVICE LETTERS, 1988, 9 (09) :442-443
[3]  
BHAT RDR, UNPUB
[4]   SURFACE AND INTERFACE DEPLETION CORRECTIONS TO FREE CARRIER-DENSITY DETERMINATIONS BY HALL MEASUREMENTS [J].
CHANDRA, A ;
WOOD, CEC ;
WOODARD, DW ;
EASTMAN, LF .
SOLID-STATE ELECTRONICS, 1979, 22 (07) :645-650
[5]   ATOMIC LAYER EPITAXY - MODELING OF GROWTH-PARAMETERS FOR DEVICE QUALITY GAAS [J].
COLAS, E ;
BHAT, R ;
NIHOUS, GC .
III-V HETEROSTRUCTURES FOR ELECTRONIC / PHOTONIC DEVICES, 1989, 145 :157-162
[6]  
COLAS E, 1989, I PHYS C SER, V96, P101
[7]   ATOMIC LAYER EPITAXY [J].
GOODMAN, CHL ;
PESSA, MV .
JOURNAL OF APPLIED PHYSICS, 1986, 60 (03) :R65-R81
[8]   MECHANISM OF CARBON INCORPORATION IN MOCVD GAAS [J].
KUECH, TF ;
VEUHOFF, E .
JOURNAL OF CRYSTAL GROWTH, 1984, 68 (01) :148-156
[9]   ATOMIC LAYER EPITAXY OF GAAS USING TRIETHYLGALLIUM AND ARSINE [J].
OHNO, H ;
OHTSUKA, S ;
ISHII, H ;
MATSUBARA, Y ;
HASEGAWA, H .
APPLIED PHYSICS LETTERS, 1989, 54 (20) :2000-2002
[10]   NEW APPROACH TO THE ATOMIC LAYER EPITAXY OF GAAS USING A FAST GAS-STREAM [J].
OZEKI, M ;
MOCHIZUKI, K ;
OHTSUKA, N ;
KODAMA, K .
APPLIED PHYSICS LETTERS, 1988, 53 (16) :1509-1511