HOLOGRAPHIC INTERFEROMETER FOR ISOPACHIC STRESS ANALYSIS

[1] ALEKSANDROV EB, 1967, SOV PHYS TECH PHYS-U, V12, P258

[2] A complete photoelastic instrument [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1940, 30 (07) : 297 - 298

[3] APPLICATION OF HOLOGRAPHY TO PHOTOELASTICITY [J]. EXPERIMENTAL MECHANICS, 1968, 8 (01) : 33 - &

[4] Frocht M., 1948, PHOTOELASTICITY, V2

[5] Isopachic stress patterns [J]. JOURNAL OF APPLIED PHYSICS, 1939, 10 (04) : 248 - 257

[6] FROCHT MM, 1948, PHOTOELASTICITY, V2, pCH7

[7] SURFACE-DEFORMATION MEASUREMENT USING WAVEFRONT RECONSTRUCTION TECHNIQUE [J]. APPLIED OPTICS, 1966, 5 (04) : 595 - +

[8] A reflection polariscope for photoelastic analysis [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1934, 5 (06) : 224 - 228

[9] SINCLAIR D, 1940, J OPT SOC AMER, V33, P511

[10] [No title captured]

[1] ALEKSANDROV EB, 1967, SOV PHYS TECH PHYS-U, V12, P258

[2] A complete photoelastic instrument [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1940, 30 (07) : 297 - 298

[3] APPLICATION OF HOLOGRAPHY TO PHOTOELASTICITY [J]. EXPERIMENTAL MECHANICS, 1968, 8 (01) : 33 - &

[4] Frocht M., 1948, PHOTOELASTICITY, V2

[5] Isopachic stress patterns [J]. JOURNAL OF APPLIED PHYSICS, 1939, 10 (04) : 248 - 257

[6] FROCHT MM, 1948, PHOTOELASTICITY, V2, pCH7

[7] SURFACE-DEFORMATION MEASUREMENT USING WAVEFRONT RECONSTRUCTION TECHNIQUE [J]. APPLIED OPTICS, 1966, 5 (04) : 595 - +

[8] A reflection polariscope for photoelastic analysis [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1934, 5 (06) : 224 - 228

[9] SINCLAIR D, 1940, J OPT SOC AMER, V33, P511

[10] [No title captured]