ANALYSIS OF THE CHARACTERISTICS OF AN EARTHED FIN LINE

被引：31
作者：
BEYER, A
机构：
来源：
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES | 1981年 / 29卷 / 07期
关键词：
D O I：
10.1109/TMTT.1981.1130428
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：676 / 680
页数：5
相关论文
共 8 条
[1]   CHARACTERISTIC IMPEDANCE OF MICROSTRIP BY METHOD OF MOMENTS [J].
FARRAR, A ;
ADAMS, AT .
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1970, MT18 (01) :65-&
[2]  
HOEFER WJR, 1979 IEEE MTTS INT M, P341
[3]  
HOFMANN H, 1977, AEU-INT J ELECTRON C, V31, P40
[4]   EQUIVALENT RELATIVE PERMITTIVITY AND UNLOADED Q-FACTOR OF INTEGRATED FINLINE [J].
MEIER, PJ .
ELECTRONICS LETTERS, 1973, 9 (07) :162-163
[5]   INTEGRATED FIN-LINE MILLIMETER COMPONENTS [J].
MEIER, PJ .
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1974, MT22 (12) :1209-1216
[6]   COMPLETE EIGENVALUE SOLUTION OF RIDGED WAVEGUIDE [J].
MONTGOMERY, JP .
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1971, MT19 (06) :547-+
[7]   SIMPLE METHOD FOR ANALYZING FIN-LINE STRUCTURES [J].
SAAD, AMK ;
SCHUNEMANN, K .
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1978, 26 (12) :1002-1007
[8]   ELECTRICAL PERFORMANCE OF FINE LINES OF VARIOUS CONFIGURATIONS [J].
SAAD, AMK ;
BEGEMANN, G .
IEE JOURNAL ON MICROWAVES OPTICS AND ACOUSTICS, 1977, 1 (02) :81-88
1