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ANALYSIS OF THE CHARACTERISTICS OF AN EARTHED FIN LINE
被引:31
作者
:
BEYER, A
论文数:
0
引用数:
0
h-index:
0
BEYER, A
机构
:
来源
:
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES
|
1981年
/ 29卷
/ 07期
关键词
:
D O I
:
10.1109/TMTT.1981.1130428
中图分类号
:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号
:
0808 ;
0809 ;
摘要
:
引用
收藏
页码:676 / 680
页数:5
相关论文
共 8 条
[1]
CHARACTERISTIC IMPEDANCE OF MICROSTRIP BY METHOD OF MOMENTS
FARRAR, A
论文数:
0
引用数:
0
h-index:
0
FARRAR, A
ADAMS, AT
论文数:
0
引用数:
0
h-index:
0
ADAMS, AT
[J].
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES,
1970,
MT18
(01)
: 65
-
&
[2]
HOEFER WJR, 1979 IEEE MTTS INT M, P341
[3]
HOFMANN H, 1977, AEU-INT J ELECTRON C, V31, P40
[4]
EQUIVALENT RELATIVE PERMITTIVITY AND UNLOADED Q-FACTOR OF INTEGRATED FINLINE
MEIER, PJ
论文数:
0
引用数:
0
h-index:
0
机构:
AIL CUTLER HAMMER,APPL ELECTR DIV,MELVILLE,NY 11746
AIL CUTLER HAMMER,APPL ELECTR DIV,MELVILLE,NY 11746
MEIER, PJ
[J].
ELECTRONICS LETTERS,
1973,
9
(07)
: 162
-
163
[5]
INTEGRATED FIN-LINE MILLIMETER COMPONENTS
MEIER, PJ
论文数:
0
引用数:
0
h-index:
0
机构:
AIRBORNE INST LAB,ADV MICROWAVE SYST DEPT,MELVILLE,NY 11746
AIRBORNE INST LAB,ADV MICROWAVE SYST DEPT,MELVILLE,NY 11746
MEIER, PJ
[J].
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES,
1974,
MT22
(12)
: 1209
-
1216
[6]
COMPLETE EIGENVALUE SOLUTION OF RIDGED WAVEGUIDE
MONTGOMERY, JP
论文数:
0
引用数:
0
h-index:
0
MONTGOMERY, JP
[J].
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES,
1971,
MT19
(06)
: 547
-
+
[7]
SIMPLE METHOD FOR ANALYZING FIN-LINE STRUCTURES
SAAD, AMK
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SAAD, AMK
SCHUNEMANN, K
论文数:
0
引用数:
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h-index:
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SCHUNEMANN, K
[J].
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES,
1978,
26
(12)
: 1002
-
1007
[8]
ELECTRICAL PERFORMANCE OF FINE LINES OF VARIOUS CONFIGURATIONS
SAAD, AMK
论文数:
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引用数:
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h-index:
0
机构:
TECH UNIV BRUNSWICK,INST HOCHFREQUENZTECH,D-3300 BRUNSWICK,FED REP GER
TECH UNIV BRUNSWICK,INST HOCHFREQUENZTECH,D-3300 BRUNSWICK,FED REP GER
SAAD, AMK
BEGEMANN, G
论文数:
0
引用数:
0
h-index:
0
机构:
TECH UNIV BRUNSWICK,INST HOCHFREQUENZTECH,D-3300 BRUNSWICK,FED REP GER
TECH UNIV BRUNSWICK,INST HOCHFREQUENZTECH,D-3300 BRUNSWICK,FED REP GER
BEGEMANN, G
[J].
IEE JOURNAL ON MICROWAVES OPTICS AND ACOUSTICS,
1977,
1
(02):
: 81
-
88
←
1
→
共 8 条
[1]
CHARACTERISTIC IMPEDANCE OF MICROSTRIP BY METHOD OF MOMENTS
FARRAR, A
论文数:
0
引用数:
0
h-index:
0
FARRAR, A
ADAMS, AT
论文数:
0
引用数:
0
h-index:
0
ADAMS, AT
[J].
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES,
1970,
MT18
(01)
: 65
-
&
[2]
HOEFER WJR, 1979 IEEE MTTS INT M, P341
[3]
HOFMANN H, 1977, AEU-INT J ELECTRON C, V31, P40
[4]
EQUIVALENT RELATIVE PERMITTIVITY AND UNLOADED Q-FACTOR OF INTEGRATED FINLINE
MEIER, PJ
论文数:
0
引用数:
0
h-index:
0
机构:
AIL CUTLER HAMMER,APPL ELECTR DIV,MELVILLE,NY 11746
AIL CUTLER HAMMER,APPL ELECTR DIV,MELVILLE,NY 11746
MEIER, PJ
[J].
ELECTRONICS LETTERS,
1973,
9
(07)
: 162
-
163
[5]
INTEGRATED FIN-LINE MILLIMETER COMPONENTS
MEIER, PJ
论文数:
0
引用数:
0
h-index:
0
机构:
AIRBORNE INST LAB,ADV MICROWAVE SYST DEPT,MELVILLE,NY 11746
AIRBORNE INST LAB,ADV MICROWAVE SYST DEPT,MELVILLE,NY 11746
MEIER, PJ
[J].
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES,
1974,
MT22
(12)
: 1209
-
1216
[6]
COMPLETE EIGENVALUE SOLUTION OF RIDGED WAVEGUIDE
MONTGOMERY, JP
论文数:
0
引用数:
0
h-index:
0
MONTGOMERY, JP
[J].
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES,
1971,
MT19
(06)
: 547
-
+
[7]
SIMPLE METHOD FOR ANALYZING FIN-LINE STRUCTURES
SAAD, AMK
论文数:
0
引用数:
0
h-index:
0
SAAD, AMK
SCHUNEMANN, K
论文数:
0
引用数:
0
h-index:
0
SCHUNEMANN, K
[J].
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES,
1978,
26
(12)
: 1002
-
1007
[8]
ELECTRICAL PERFORMANCE OF FINE LINES OF VARIOUS CONFIGURATIONS
SAAD, AMK
论文数:
0
引用数:
0
h-index:
0
机构:
TECH UNIV BRUNSWICK,INST HOCHFREQUENZTECH,D-3300 BRUNSWICK,FED REP GER
TECH UNIV BRUNSWICK,INST HOCHFREQUENZTECH,D-3300 BRUNSWICK,FED REP GER
SAAD, AMK
BEGEMANN, G
论文数:
0
引用数:
0
h-index:
0
机构:
TECH UNIV BRUNSWICK,INST HOCHFREQUENZTECH,D-3300 BRUNSWICK,FED REP GER
TECH UNIV BRUNSWICK,INST HOCHFREQUENZTECH,D-3300 BRUNSWICK,FED REP GER
BEGEMANN, G
[J].
IEE JOURNAL ON MICROWAVES OPTICS AND ACOUSTICS,
1977,
1
(02):
: 81
-
88
←
1
→