ELLIPSOMETRIC DETERMINATION OF OPTICAL ANISOTROPY OF GALLIUM SELENIDE

被引:47
作者
MEYER, F [1 ]
KLUIZENA.EE [1 ]
ENGELSEN, DD [1 ]
机构
[1] NV PHILIPS GLOEILAMPENFABRIEKEN,RES LABS,EINDHOVEN,NETHERLANDS
关键词
D O I
10.1364/JOSA.63.000529
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
引用
收藏
页码:529 / 532
页数:4
相关论文
共 14 条
[11]   ELLIPSOMETRY AND CLEAN SURFACES OF SILICON AND GERMANIUM [J].
MEYER, F ;
DEKLUIZE.EE ;
BOOTSMA, GA .
SURFACE SCIENCE, 1971, 27 (01) :88-+
[12]   ANISOTROPY OF OPTICAL-CONSTANTS OF GASE NEAR BAND EDGE [J].
WASSCHER, JD ;
DIELEMAN, J .
PHYSICS LETTERS A, 1972, A 39 (04) :279-&
[13]  
Williams R. H., 1972, J VAC SCI TECHNOL, V2, P867
[14]  
WUNSCHE A, 1970, ANN PHYS-BERLIN, V25, P201