ELLIPSOMETRIC DETERMINATION OF OPTICAL ANISOTROPY OF GALLIUM SELENIDE

被引：47

作者：

MEYER, F ^{[1
]}

KLUIZENA.EE ^{[1
]}

ENGELSEN, DD ^{[1
]}

机构：

[1] NV PHILIPS GLOEILAMPENFABRIEKEN,RES LABS,EINDHOVEN,NETHERLANDS

来源：

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA | 1973年 / 63卷 / 05期

关键词：

D O I：

10.1364/JOSA.63.000529

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页码：529 / 532

页数：4

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[10] MEASUREMEMT OF THICKNESS AND REFRACTIVE INDEX OF VERY THIN FILMS AND OPTICAL PROPERTIES OF SURFACES BY ELLIPSOMETRY [J].

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