Review of inductively coupled plasmas for plasma processing

被引:621
作者
Hopwood, J. [1 ]
机构
[1] IBM Corp, Div Res, Thomas J Watson Res Ctr, Yorktown Hts, NY 10598 USA
关键词
D O I
10.1088/0963-0252/1/2/006
中图分类号
O35 [流体力学]; O53 [等离子体物理学];
学科分类号
070204 ; 080103 ; 080704 ;
摘要
The need for large-area, high-density plasma sources for plasma-aided manufacturing of integrated circuits has created a renewed interest in inductively coupled plasmas (ICPS). In this paper several ICP reactor geometries are briefly reviewed. Typically, inductive coupling of RF power (0.5-28 MHz) can produce ion densities in excess of 10(12) cm(-3) even at sub-millitorr pressures. Existing electromagnetic field models of ICPS are examined and found to be in reasonable agreement with experimental results. Sputter deposition, anodic silicon oxidation and polymer etching using ICPS are also described. It is concluded that ICPS are promising candidates for meeting the future requirements of plasma processing, although considerable process development. plasma characterization and modelling are still needed
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页码:109 / 116
页数:8
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