HELIUM LEAK TESTING OF PRESSURIZED TELEPHONE CABLES

被引：0

作者：

HENNIGAR, GW

机构：

来源：

MATERIALS EVALUATION | 1990年 / 48卷 / 02期

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D O I：

暂无

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

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页码：124 / 127

页数：4

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