ELECTRON-BEAM MODIFICATIONS OF INP SURFACES

被引：3
|
作者：
MILNE, RH
FAN, TW
机构：
来源：
JOURNAL OF MICROSCOPY-OXFORD | 1987年 / 147卷
关键词：
D O I：
10.1111/j.1365-2818.1987.tb02819.x
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
引用
收藏
页码：75 / 81
页数：7
相关论文
共 50 条
  • [1] MODIFICATIONS OF INP(110) SURFACES INDUCED BY ELECTRON-BEAM DURING AUGER MEASUREMENT
    DUMAS, M
    BENKACEM, M
    LASSABATERE, L
    THIN SOLID FILMS, 1989, 172 (01) : L65 - L70
  • [2] Modifications of InP(110) surfaces induced by electron beam during Auger measurement
    Dumas, M., 1600, (172):
  • [3] ELECTRON-BEAM MODIFICATIONS FOR THE TREATMENT OF SUPERFICIAL MALIGNANCIES
    DAS, IJ
    KASE, KR
    COPELAND, JF
    FITZGERALD, TJ
    INTERNATIONAL JOURNAL OF RADIATION ONCOLOGY BIOLOGY PHYSICS, 1991, 21 (06): : 1627 - 1634
  • [4] Electron-beam modification of silicate glass surfaces
    J Non Cryst Solids, 1-2 (87):
  • [5] ELECTRON-BEAM MODIFICATION OF SILICATE GLASS SURFACES
    DUDKO, YV
    KRAVCHENKO, AA
    CHEREDNICKENKO, DI
    JOURNAL OF NON-CRYSTALLINE SOLIDS, 1995, 188 (1-2) : 87 - 92
  • [6] RBS ANALYSIS OF GAAS AND INP AFTER ELECTRON-BEAM ANNEALING
    ROLAND, G
    BAUMANN, H
    BETHGE, K
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1990, 50 (1-4): : 145 - 149
  • [7] ELECTRON-BEAM INDUCED REACTIONS OF OXYGEN ON THE INP(110) SURFACE
    ZEMEK, J
    LESIAKORLOWSKA, B
    JABLONSKI, A
    PROGRESS IN SURFACE SCIENCE, 1990, 35 (1-4) : 79 - 83
  • [8] THE EFFECT OF THE IMAGING ELECTRON-BEAM ON INP/INGAAS MQW STRUCTURES
    BROWN, PD
    BITHELL, EG
    HUMPHREYS, CJ
    SKEVINGTON, PJ
    PERRIN, SD
    DAVIES, GJ
    MICROSCOPY OF SEMICONDUCTING MATERIALS 1993, 1993, (134): : 493 - 496
  • [9] DEFLECTION OF THE ELECTRON-BEAM IN ELECTRON-BEAM WELDING
    NAZARENKO, OK
    AUTOMATIC WELDING USSR, 1982, 35 (01): : 28 - 33
  • [10] ELECTRON-BEAM ELECTROREFLECTANCE STUDIES OF GAAS AND CDTE SURFACES
    RACCAH, PM
    GARLAND, JW
    BUTTRILL, SE
    FRANCKE, L
    JACKSON, J
    APPLIED PHYSICS LETTERS, 1988, 52 (19) : 1584 - 1586
12345