BENIGN MAKING OF SHARP TIPS FOR STM AND FIM - PT, IR, AU, PD, AND RH

被引：65

作者：

NAM, AJ

TEREN, A

LUSBY, TA

MELMED, AJ

机构：

[1] Johns Hopkins Univ, Baltimore

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1995年 / 13卷 / 04期

关键词：

547.1 Precious Metals - 701.1 Electricity: Basic Concepts and Phenomena - 804.2 Inorganic Compounds - 931.2 Physical Properties of Gases; Liquids and Solids - 942.2 Electric Variables Measurements;

D O I：

10.1116/1.588186

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Sharp tips for various modern microscopies, such as field-ion microscopy (FIM) and scanning tunneling microscopy (STM), can be prepared by electropolishing in solutions which are relatively innocuous for the environment as well as the researcher, compared to the often hazardous solutions still in widespread use. We have made measurements of polishing times as a function of solution and voltage parameters and we report conditions for electropolishing sharp tips of Pt, Ir, Au, Pd, and Rh using relatively benign solutions. (C) 1995 American Vacuum Society.

引用

页码：1556 / 1559

页数：4

共 6 条

[1] EXPERIMENTAL-METHOD FOR PREPARING NANOMETER-SCALE PD PROBE [J].