LASER-DIODES FOR LENGTH DETERMINATION USING SWEPT-FREQUENCY INTERFEROMETRY

被引:14
|
作者
BARWOOD, GP
GILL, P
ROWLEY, WRC
机构
[1] Div. of Mech. and Opt. Metrol., NPL, Teddington
关键词
D O I
10.1088/0957-0233/4/9/012
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
A 780 nm diode laser swept-frequency heterodyne facility is described and its use demonstrated for accurate determination of the optical path length of two stable Fabry-Perot etalons. A frequency sweep of about 4 GHz is accurately determined by heterodyning against a fixed frequency stabilized reference laser. A measurement accuracy of 5 x 10(-6) is demonstrated with one etalon by comparison with results from an independent multi-wavelength determination of the length. A standard error of the mean (1sigma) of a few parts per million or better is achieved. Ultimately, a 1 sigma length uncertainty of about 1.5 x 10(-10) should be possible on stable optical structures by using frequency scans of ten to a hundred times the present range, in conjunction with a fixed frequency reference at 780 nm.
引用
收藏
页码:988 / 994
页数:7
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