EFFECTS OF WELL NUMBER, CAVITY LENGTH, AND FACET REFLECTIVITY ON THE REDUCTION OF THRESHOLD CURRENT OF GAAS/ALGAAS MULTIQUANTUM WELL LASERS

被引：50

作者：

KUROBE, A

FURUYAMA, H

NARITSUKA, S

SUGIYAMA, N

KOKUBUN, Y

NAKAMURA, M

机构：

[1] Toshiba Corp, Kawasaki, Jpn, Toshiba Corp, Kawasaki, Jpn

来源：

IEEE JOURNAL OF QUANTUM ELECTRONICS | 1988年 / 24卷 / 04期

关键词：

D O I：

10.1109/3.172

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

12

引用

收藏

页码：635 / 639

页数：5

相关论文

共 12 条

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