LRM PROBE-TIP CALIBRATIONS USING NONIDEAL STANDARDS

被引：54

作者：

WILLIAMS, DF

MARKS, RB

机构：

[1] National Institute of Standards and Technology, Boulder

来源：

IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES | 1995年 / 43卷 / 02期

关键词：

D O I：

10.1109/22.348112

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The line-reflect-match calibration is enhanced to accommodate imperfect match standards and lossy lines typical of monolithic microwave integrated circuits. We characterize the match and line standards using an additional line standard of moderate Length. The new method. provides a practical means of obtaining accurate, wideband calibrations with compact standard sets. Without the enhancement, calibration errors due to imperfections in typical standards can be severe.

引用

页码：466 / 469

页数：4

共 12 条

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