QUANTITATIVE METHOD FOR THE DETERMINATION OF FIBER TEXTURE

[1] BARRETT CS, 1952, STRUCTURE METALS, P618

[2] On the factors affecting the reflection intensities by the several methods of x-ray analysis of crystal structures [J]. REVIEWS OF MODERN PHYSICS, 1933, 5 (03) : 0169 - 0202

[3] BRADLEY AJ, 1935, P PHYS SOC LOND, V47, P879

[4] BURNETT HC, 1955, WIRE WIRE PROD, V32, P1375

[5] CHERNOCK, 1956, J APPL PHYS, V27, P1170

[6] Claassen A, 1930, PHILOS MAG, V9, P57

[7] CULLITY BD, 1956, ELEMENTS XRAY DIFFRA, P270

[8] DECKER, 1948, J APPL PHYS, V19, P388

[9] REFLECTION METHOD OF DETERMINING PREFERRED ORIENTATION ON THE GEIGER-COUNTER SPECTROMETER [J]. JOURNAL OF APPLIED PHYSICS, 1949, 20 (08) : 741 - 745

[10] HARRIS GB, 1952, PHILOS MAG, V43, P113

[1] BARRETT CS, 1952, STRUCTURE METALS, P618

[2] On the factors affecting the reflection intensities by the several methods of x-ray analysis of crystal structures [J]. REVIEWS OF MODERN PHYSICS, 1933, 5 (03) : 0169 - 0202

[3] BRADLEY AJ, 1935, P PHYS SOC LOND, V47, P879

[4] BURNETT HC, 1955, WIRE WIRE PROD, V32, P1375

[5] CHERNOCK, 1956, J APPL PHYS, V27, P1170

[6] Claassen A, 1930, PHILOS MAG, V9, P57

[7] CULLITY BD, 1956, ELEMENTS XRAY DIFFRA, P270

[8] DECKER, 1948, J APPL PHYS, V19, P388

[9] REFLECTION METHOD OF DETERMINING PREFERRED ORIENTATION ON THE GEIGER-COUNTER SPECTROMETER [J]. JOURNAL OF APPLIED PHYSICS, 1949, 20 (08) : 741 - 745

[10] HARRIS GB, 1952, PHILOS MAG, V43, P113